Study of birefringence in porous silicon layers by IR Fourier spectroscopy

Author: Kuznetsova L.   Efimova A.   Osminkina L.   Golovan’ L.   Timoshenko V.   Kashkarov P.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7834

Source: Physics of the Solid State, Vol.44, Iss.5, 2002-05, pp. : 811-815

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