A method of determining the charge trapped at the interfaces of a metal/ferroelectric/metal thin-film structure

Author： Delimova L.   Grekhov I.   Mashovets D.   Shin S.   Koo J.   Kim S.   Park Y.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7834

Source： Physics of the Solid State, Vol.48, Iss.6, 2006-06, pp. : 1182-1185

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