Characteristics of the formation of radiation defects in silicon structures

Author： Makhkamov Sh.   Tursunov N.   Ashurov M.   Saidov R.   Martynchenko S.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7842

Source： Technical Physics, Vol.44, Iss.1, 1999-01, pp. : 110-112

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