Determination of the metal nanometer layer thickness and semiconductor conductivity in metal-semiconductor structures from electromagnetic reflection and transmission spectra

Author： Usanov D.   Skripal A.   Abramov A.   Bogolyubov A.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7842

Source： Technical Physics, Vol.51, Iss.5, 2006-05, pp. : 644-649

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