Electrostatic and van der Waals forces in the air contact between the atomic force microscope probe and a conducting surface

Author： Dedkov G.   Kanametov A.   Dedkova E.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7842

Source： Technical Physics, Vol.54, Iss.12, 2009-12, pp. : 1801-1807

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