Author: Ognev L.
Publisher: MAIK Nauka/Interperiodica
ISSN: 1063-7850
Source: Technical Physics Letters, Vol.31, Iss.4, 2005-04, pp. : 314-315
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Laboratory X-ray microscopy with reflective – refractive lens system
Journal of Physics: Conference Series , Vol. 186, Iss. 1, 2009-09 ,pp. :
Specific properties of X-ray compound refractive lens.Theoretical analysis
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :