Luminescence intensity monitoring in a MOS tunnel structure with inhomogeneous thickness of the insulator

Author： Tyaginov S.   Asli N.   Vexler M.   Shulekin A.   Seegebrecht P.   Grekhov I.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.31, Iss.4, 2005-04, pp. : 336-338

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