Proton-induced failures in high-power field-effect transistors

Author: Ivanov N.   Mitin E.   Pashuk V.   Tverskoy M.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.37, Iss.1, 2011-01, pp. : 58-61

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