Laser ablation inductively coupled plasma mass spectrometry for direct analysis of the spatial distribution of trace elements in metallurgical-grade silicon

Author: Pisonero Jorge   Kroslakova Ivana   Günther Detlef   Latkoczy Christopher  

Publisher: Springer Publishing Company

ISSN: 1618-2642

Source: Analytical and Bioanalytical Chemistry, Vol.386, Iss.1, 2006-09, pp. : 12-20

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