AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors

Author: Fian A.   Haase A.   Stadlober B.   Jakopic G.   Matsko N.   Grogger W.   Leising G.  

Publisher: Springer Publishing Company

ISSN: 1618-2642

Source: Analytical and Bioanalytical Chemistry, Vol.390, Iss.6, 2008-03, pp. : 1455-1461

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