Structure Analysis of Advanced Nanomaterials

Author: Oku   Takeo  

Publisher: De Gruyter‎

Publication year: 2014

E-ISBN: 9783110305012

P-ISBN(Paperback): 9783110304725

Subject: TN16 electronic optical instrument

Keyword: 一般工业技术,能源与动力工程

Language: ENG

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Description

High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.

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