Diffraction Stress Analysis in Thin Films and Coatings--Problems, Methods and Perspectives

ISSN： 1023-8166

Source： Journal of Neutron Research, Vol.12, Iss.1-3, 2004-01, pp. : 233-241

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Control of the structure and stress state of thin films and coatings in the process of their preparation by ion-plasma methods

By Sobol' O.

Physics of the Solid State, Vol. 53, Iss. 7, 2011-07 ,pp. : 1464-1473

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Methods for investigation of stress concentrations in thin-walled structures by reduction of boundary value problems to initial value problems

By Vinogradov Yu.

Doklady Physics, Vol. 51, Iss. 12, 2006-12 ,pp. : 676-679

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Photoelectron Diffraction : a Structural Probe for Epitaxial Thin Films

Le Journal de Physique IV, Vol. 05, Iss. C5, 1995-06 ,pp. : C5-861-C5-861

Edp Sciences

Access to resources Recommend Favorite

Morphological Analysis of Thin Barrier Films

Journal of Magnetohydrodynamics, Plasma, and Space Research, Vol. , Iss. , 2016-01 ,pp. : 89-92

Nova Science Publishers, Inc.

Access to resources Recommend Favorite

Analysis of AuPd thin coatings on lead frames

Le Journal de Physique IV, Vol. 118, Iss. 1, 2004-11 ,pp. : 213-219

Edp Sciences

Access to resources Recommend Favorite