Determination of Effect of X-ray Tube Emission Current (IE) on Intensities of X-rays for Two Different Sample Preparation Method Using Correction Factor in WDXRF Spectrometer

By Demir Faruk   Budak Gokhan   Karabulut Abdulhalik  

Instrumentation Science & Technology, Vol. 37, Iss. 4, 2009-07 ,pp. : 437-445

Taylor & Francis Ltd

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Size-Resolved Source Apportionment of Aerosol Particles with a Confocal Micro X-Ray Fluorescence Spectrometer

By Sun Tianxi   Liu Zhiguo   Li Yude   Ma Yongzhong   Wang Guangfu   Zhu Guanghua   Xu Qing   Lin Xiaoyan   Luo Ping   Pan Qiuli   Liu Hui   Teng Yuepeng   Ding Xunliang  

Applied Spectroscopy, Vol. 65, Iss. 12, 2011-12 ,pp. : 1398-1402

Society for Applied Spectroscopy

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Sample Spinning in X-Ray Spectrometry

By Ellis A. T.   Leyden D. E.  

Applied Spectroscopy, Vol. 39, Iss. 5, 1985-09 ,pp. : 881-882

Society for Applied Spectroscopy

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Integral Reflection Coefficient of X-ray Spectrometer Crystals

By Gilfrich J. V.   Brown D. B.   Burkhalter P. G.  

Applied Spectroscopy, Vol. 29, Iss. 4, 1975-07 ,pp. : 322-326

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Evaluations of particle size and strain values from X‐ray line breadths and line shapes in α‐AgCd alloys

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Acta Crystallographica, Vol. 21, Iss. 5, 1966-11 ,pp. : 820-821

John Wiley & Sons Inc

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