Resolution of Sick Building Syndrome in a High-Security Facility

Author: Hiipakka David W.   Buffington John R.  

Publisher: Taylor & Francis Ltd

ISSN: 1521-0898

Source: Applied Occupational and Environmental Hygiene, Vol.15, Iss.8, 2000-08, pp. : 635-643

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next