Fatigue Problems of the Future: High-Cycle Fatigue Failures of Silicon MEMS

Author: Muhlstein C. L.   Stach E. A.   Ritchie R. O.  

Publisher: Engineering Integrity Society

ISSN: 1365-4101

Source: Engineering Integrity, Vol.14, Iss.1, 2003-07, pp. : 4-12

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Abstract