A WIP-based exception-management model for integrated circuit back-end production processes

Author: Guo Ruey-Shan   Chiang David   Pai Fan-Yun  

Publisher: Springer Publishing Company

ISSN: 0268-3768

Source: The International Journal of Advanced Manufacturing Technology, Vol.33, Iss.11-12, 2007-08, pp. : 1263-1274

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