Author: Moharrami N Oila A Bull S J
Publisher: IOP Publishing
ISSN: 0022-3727
Source: Journal of Physics D: Applied Physics, Vol.47, Iss.31, 2014-08, pp. : 315104-315119
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Synthesis and characterization of copper nanostructures on silicon substrates
Journal of Physics: Conference Series , Vol. 114, Iss. 1, 2008-05 ,pp. :
CMOS-MEMS Test-Key for Extracting Wafer-Level Mechanical Properties
By Chuang Wan-Chun Hu Yuh-Chung Chang Pei-Zen
Sensors, Vol. 12, Iss. 12, 2012-12 ,pp. :