Trapping Behavior of He in Ti Revisited by ab initio Calculations

Author: Chu-Bin Wan   Xiao-Song Zhou   Shi-Na Li   Hui-Jun Zhang   Jian-Hua Liang   Shu-Ming Peng   Xin Ju  

Publisher: IOP Publishing

ISSN: 0256-307X

Source: Chinese Physics Letters, Vol.31, Iss.1, 2014-01, pp. : 17102-17105

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