Interface roughness scattering considering the electrical field fluctuation in undoped AlxGa1−xN/GaN heterostructures

Author: Feng Yuxia   Liu Guipeng   Yang Shaoyan   Wei Hongyuan   Liu Xianglin   Zhu Qinsheng   Wang Zhanguo  

Publisher: IOP Publishing

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.29, Iss.4, 2014-04, pp. : 45015-45018

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