Author: Joo Min-Kyu Mouis Mireille Jeon Dae-Young Barraud Sylvain Kim Gyu-Tae Ghibaudo Gérard
Publisher: IOP Publishing
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.29, Iss.4, 2014-04, pp. : 45024-45036
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