Author: Fujioka A Asada K Yamada H Ohtsuka T Ogawa T Kosugi T Kishikawa D Mukai T
Publisher: IOP Publishing
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.29, Iss.8, 2014-06, pp. : 84005-84009
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.