Mapping chemical concentration in binary thin organic films via multi-wavelength scanning absorption microscopy (MWSAM)

Author: Berriman Garth   Routley Ben   Holdsworth John   Zhou Xiaojing   Belcher Warwick   Dastoor Paul  

Publisher: IOP Publishing

ISSN: 0957-0233

Source: Measurement Science and Technology, Vol.25, Iss.9, 2014-09, pp. : 95901-95906

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