Experimental and theoretical analysis of transport properties of core–shell wire light emitting diodes probed by electron beam induced current microscopy

Author： Lavenus P   Messanvi A   Rigutti L     Zhang H   Bayle F   Julien F H   Eymery J   Durand C   Tchernycheva M  

Publisher： IOP Publishing

ISSN： 0957-4484

Source： Nanotechnology, Vol.25, Iss.25, 2014-06, pp. : 255201-255221

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