Single event effect in a ferroelectric-gate field-effect transistor under heavy-ion irradiation

Author： Shao-An Yan   Ming-Hua Tang   Wen Zhao   Hong-Xia Guo   Wan-Li Zhang   Xin-Yu Xu   Xu-Dong Wang   Hao Ding   Jian-Wei Chen   Zheng Li   Yi-Chun Zhou  

Publisher： IOP Publishing

ISSN： 1674-1056

Source： Chinese Physics B, Vol.23, Iss.4, 2014-04, pp. : 46104-46108

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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