Author: Wenjian Li Jinhuo Chen Shuying Cheng Yongshun Wang
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.35, Iss.2, 2014-02, pp. : 23001-23004
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.