Author: Xiaolong Liu Lei Zhang Li Zhang Yan Wang Zhiping Yu
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.35, Iss.7, 2014-07, pp. : 75002-75008
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.