A new $\gamma^{*} p/\bar pp$ factorization test in diffraction, valid below $Q^2 \sim 6$ GeV2

Author： Erhan S.   Schlein P.  

Publisher： Springer Publishing Company

ISSN： 1434-6044

Source： The European Physical Journal C - Particles and Fields, Vol.33, Iss.3, 2004-03, pp. : 325-332

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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