On the migration of defects and impurities in microelectromechanical systems subject to a large number of light pulses

Author： Wautelet M.   Dauchot J.P.   Hecq M.  

Publisher： Springer Publishing Company

ISSN： 0947-8396

Source： Applied Physics A, Vol.73, Iss.4, 2001-10, pp. : 425-427

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