Image-based magnification calibration for electron microscope

Author： Ito Koichi   Suzuki Ayako   Aoki Takafumi   Tsuneta Ruriko  

Publisher： Springer Publishing Company

ISSN： 0932-8092

Source： Machine Vision and Applications, Vol.25, Iss.1, 2014-01, pp. : 185-197

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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