Analysis of contact phenomena between a head stack assembly and disk during operational shock

Author: Kim Seokhwan   Lim Geonyup   Park No-Cheol   Park Young-Pil   Lee Hyun-Chul   Kim Ju-Ho   Park Kyoung-Su  

Publisher: Springer Publishing Company

ISSN: 0946-7076

Source: Microsystem Technologies, Vol.19, Iss.9-10, 2013-09, pp. : 1587-1593

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