Test object for emission electron microscope

Author： Chernov S.   Makukha Z.   Protsenko I.   Nepijko S.   Elmers H.   Schönhense G.  

Publisher： Springer Publishing Company

ISSN： 0947-8396

Source： Applied Physics A, Vol.114, Iss.4, 2014-03, pp. : 1383-1385

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