X-ray diffraction analyses of RF sputtered Ba0.6Sr0.4TiO3 thin films grown on Pt/Ti/LaAlO3 (100) substrates

Author: Chen Hongwei   Tan Yu   Ji Hong   Chen Linling   Zeng Li   Liu Lang   Zhang Jihua   Yang Chuanren  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.25, Iss.4, 2014-04, pp. : 1999-2003

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