On the Poisson ratio and XRD determination of strain in thin films of Ce0.8Gd0.2O1.9

Author: Kossoy Anna   Wachtel Ellen   Lubomirsky Igor  

Publisher: Springer Publishing Company

ISSN: 1385-3449

Source: Journal of Electroceramics, Vol.32, Iss.1, 2014-02, pp. : 47-50

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