Definitive Molecular Level Characterization of Defects in UiO‐66 Crystals

Publisher: John Wiley & Sons Inc

E-ISSN: 1521-3773|54|38|11162-11167

ISSN: 1433-7851

Source: ANGEWANDTE CHEMIE INTERNATIONAL EDITION, Vol.54, Iss.38, 2015-09, pp. : 11162-11167

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract