Characterization of Cr‐doped Sb2Te3 films and their application to phase‐change memory

Publisher: John Wiley & Sons Inc

E-ISSN: 1862-6270|9|8|470-474

ISSN: 1862-6254

Source: PHYSICA STATUS SOLIDI - RAPID RESEARCH LETTERS (ELECTRONIC), Vol.9, Iss.8, 2015-08, pp. : 470-474

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract