Variable‐Length Computerized Adaptive Testing Using the Higher Order DINA Model

Publisher: John Wiley & Sons Inc

E-ISSN: 1745-3984|52|2|125-143

ISSN: 0022-0655

Source: JOURNAL OF EDUCATIONAL MEASUREMENT, Vol.52, Iss.2, 2015-06, pp. : 125-143

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract