MRT letter: A unified accelerated maximum likelihood technique for widefield, confocal, and super‐resolution 4Pi microscopy

Publisher: John Wiley & Sons Inc

E-ISSN: 1097-0029|78|5|331-335

ISSN: 1059-910x

Source: MICROSCOPY RESEARCH AND TECHNIQUE, Vol.78, Iss.5, 2015-05, pp. : 331-335

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Abstract