Radiation‐damage‐induced phasing: a case study using UV irradiation with light‐emitting diodes

Publisher: John Wiley & Sons Inc

E-ISSN: 2059-7983|72|3|395-402

ISSN: 2059-7983

Source: Acta Crystallographica Section D, Vol.72, Iss.3, 2016-03, pp. : 395-402

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Abstract