Elaboration and characterization of PNZT thin films deposited on silicon by RF cathodic sputtering*

Author: Haccart T.   Cattan E.   Rèmiens D.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|11|2|103-106

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.11, Iss.2, 2010-03, pp. : 103-106

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Abstract