Phase segregation, Cu migration and junction formationin Cu(In, Ga)Se₂

Author： Herberholz R. Rau U. Schock H. W. Haalboom T. Gödecke T. Ernst F. Beilharz C. Benz K. W. Cahen D.

E-ISSN： 1286-0050|6|2|131-139

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.6, Iss.2, 2010-03, pp. : 131-139

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