Author： Djerdir A. Hiebel P. Voisin E. Kauffmann J.-M.
Publisher： Edp Sciences
E-ISSN： 1286-0050|28|2|213-225
ISSN： 1286-0042
Source： EPJ Applied Physics (The), Vol.28, Iss.2, 2004-08, pp. : 213-225
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