Noise measurements on single electron transistors using bias switching read-out

Author： Hakonen P. J.   Kiviranta M.   Penttilä J. S.   Paalanen M. A.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|11|3|227-229

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.11, Iss.3, 2010-03, pp. : 227-229

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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