Determination of the electron mean free path in the 1–1.8 eV energy range inthin gold layers using ballistic electron emission microscopy

Author: Coratger R.   Girardin C.   Pechou R.   Ajustron F.   Beauvillain J.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|5|3|237-242

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.5, Iss.3, 2010-03, pp. : 237-242

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Abstract