Author： Cervenka J. Klima R. Knaipp M. Selberherr S.
Publisher： Edp Sciences
E-ISSN： 1286-0050|21|2|103-106
ISSN： 1286-0042
Source： EPJ Applied Physics (The), Vol.21, Iss.2, 2002-12, pp. : 103-106
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