Author: Le Pioufle B. Fauvarque J. F. Delalande P.
Publisher: Edp Sciences
E-ISSN: 1286-0050|2|3|257-265
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.2, Iss.3, 2010-03, pp. : 257-265
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Abstract