Electrostatic displacement of multiwalled carbon nanotubes by scanning a voltage-applied tip of an atomic force microscope

Author： Kim D.-H.   Koo J.-Y.   Kim J.-J.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|28|3|301-304

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.28, Iss.3, 2004-11, pp. : 301-304

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