Monitoring the structural and chemical properties of CN_x thin films during in situ annealing in a TEM

Author： Grillo S. E. Hellgren N. Serin V. Broitman E. Colliex C. Hultman L. Kihn Y.

E-ISSN： 1286-0050|13|2|97-105

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.13, Iss.2, 2010-03, pp. : 97-105

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