TEM measurement of the misfit stress by a curvature method in semiconducting epitaxial system

Author: Ponchet A.   Cabié M.   Rocher A.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|26|2|87-94

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.26, Iss.2, 2004-03, pp. : 87-94

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