Real-time high-resolution topographic imagery using interference microscopy

Author: Dubois A.   Vabre L.   Boccara A.-C.   Montgomery P. C.   Cunin B.   Reibel Y.   Draman C.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|20|3|169-175

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.20, Iss.3, 2002-11, pp. : 169-175

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