Detection of an evanescent field scattered by silicon tipsin an apertureless scanning near-field optical microscope*

Author： Laddada R.   Benrezzak S.   Adam P. M.   Viardot G.   Bijeon J. L.   Royer P.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|6|2|171-178

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.6, Iss.2, 2010-03, pp. : 171-178

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